This topic will explore aspects of the new initiatives in the semiconductor industry funded by the CHIPs in Science Act that involve both related industry and academic activities. Marla Dowell, Director of the National Metrology Center established by the Chips Act at NIST, will give the AVS Plenary Address. The all-invited Chips Act session on Monday morning will describe industry roadmaps for information and communications technology (ICT), metrology, characterization, as well as workforce development. The overlap between Optoelectronics and the Chips in Science Act will also be described. At the end of the invited presentations, Erica Douglas will lead a panel session on the Chips in Science Act that will involve the invited speakers.
CPS-MoM: CHIPS Act Mini-Symposium
- Markus Kuhn, Rigaku, “Challenges and Opportunities in Characterization and Metrology for the Microelectronics and Advanced Packaging Technologies (MAPT) Roadmap”
- Nancy Louwagie, Normandale Community College, “Bridging Opportunities and Challenges: Examining a Community College’s Role in Preparing Technicians for the Semiconductor Industry”
- Volker Sorger, University of Florida, “CHIPs Act and Optoelectronics, Devices, and AI/ML”
- Victor Zhirnov, Semiconductor Research Corporation, “Strategic Roadmapping for Information and Communication Technologies”
CPS-ThP: CHIPS Act Mini-Symposium Poster Session