The Spectroscopic Ellipsometry Group integrates themes ranging from classical materials science and thin film characterization to nanometer-scale science and novel optical sensing concepts. We will host five oral sessions dedicated to traditional applications of spectroscopic ellipsometry in optical materials and thin film characterization as well as new and emerging topics. The aim of the Spectroscopic Ellipsometry group is to improve the accessibility of this conference for undergraduate and graduate students. To this end, we have worked with our industry partners to establish funding to offset the registration costs of students. Additionally, the J.A. Woollam Co. continues to proudly sponsor the Outstanding Student Oral Award as well as the Outstanding Student Poster Award.
Areas of Interest: Spectroscopic Ellipsometry is seeking abstracts in the following areas of interest:
- Workforce Development: Reserved for student speakers to showcase their many contributions to the field and demonstrate the workforce development needed as metrology needs continue to grow in the industry.
- Fundamental Ellipsometry Applications: Applications such as Mueller matrix ellipsometry, in-situ ellipsometry, anisotropy, finite ellipsometry, and biological applications.
- Emerging Applications: Groundbreaking applications in areas like quantum materials, highly anisotropic materials, and ultra-wide bandgap materials.
- Evolving Methodology of Ellipsometry: Showcasing the advances in instrumentation.
- Analytical Methods in Ellipsometry: Addresses data selection, mathematical models, and integration of artificial intelligence.
EL1: Spectroscopic Ellipsometry Oral Session
Invited Speakers:
- Thomas Germer, NIST
- Max Junda, Covalent Metrology
- Morten Kildemo, Norwegian Uni. of Sci. and Tech, Norway
- Andrei Sirenko, New Jersey Institute of Technology
- Chris Sturm, University Leipzig, Germany
EL2: Spectroscopic Ellipsometry Poster Session