Chemical and physical processes occurring at surfaces and gas-liquid, solid-liquid, and gas/plasma-solid interfaces are crucial for many applications, and yet their analysis often represents grand scientific and engineering challenges. The Chemical Analysis and Imaging at Interfaces Focus Topic symposium is designed as a cross-disciplinary “melting pot” and aims to disseminate the latest developments in experimental methods and understanding of the interfacial physical and chemical processes relevant (but not limited) to materials synthesis, microfabrication, energy/catalysis research, biomedical applications, environmental sciences, and surface modifications, to name a few. In particular, in (ex-) situ/in vivo/operando chemical imaging, microscopy and spectroscopy studies using electron, X-ray, ion, and neutron beams as well as optical methods and synchrotron radiation/ FEL facilities are strongly encouraged. Attention will also be paid to correlative spectroscopy and microscopy methods, modern image/spectra processing, and AI-enabling data analytics techniques. Contributions are invited including but not limited to experimental, fundamental research, industrial R&D, novel analytical techniques/approaches, and metrology of realistic surfaces and interfaces.
CA-ThM: In Situ and Operando Analysis of Energy and Environmental Interfaces I
- Barbara A.J. Lechner, Technical University of Munich, Germany, “The Dynamics of Encapsulated Clusters Under the Microscope”
- Bin Li, Oak Ridge National Laboratory, USA, “Rationally Engineering Interfaces to Improve Performances of Li Metal Batteries”
CA-ThA: In Situ and Operando Analysis of Energy and Environmental Interfaces II
- Wei-Chang David Yang, National Institute of Standards and Technology (NIST), “Advancing Carbon Dioxide Removal Technologies with Microscopic Insights Gained Using in-Situ and Operando Transmission Electron Microscopy”
- Difan Zhang, Pacific Northwest National Laboratory, “Understanding the Molecular Rearrangement at Interface by Atomic Modeling”
CA-ThP: Chemical Analysis and Imaging of Interfaces Poster Session
CA-FrM: Materials, Interfaces, and Metrologies for Electronics
- Alex Belianinov, Sandia National Laboratory, “Focused Ion Beam Low Energy Implantation “
- Robert Nemanich, Arizona State University, “Surface Transfer – Modulation Doping at the Diamond-Dielectric Interface”