The Applied Surface Science Division provides a world-leading forum for the design and characterization of the surfaces and interfaces that underpin technologies ranging from medical implants to electronic devices.
The session topics include “Theory, Surface Structure, and Processes” (TuA) with a focus on the extraction of chemical and physical information from core-level spectroscopies with a particular concern for the electronic structure of the systems. The “Quantitative Surface Analysis” session (WeM) offers a deep dive into quantitative analysis with an emphasis on XPS and HAXPES. The following session about “Advanced Materials and Methods” (WeA) addresses both the fundamental and practical surface analytical science of next-generation devices including batteries and electrode materials to support innovation in sustainable technologies. The “Machine Learning and Data Evaluation” session (ThM) covers up-and-coming topics about peak fitting, modeling, denoising, and machine learning. This session also highlights the Peter M.A. Sherwood Mid-Career Award presentation about the fundamentals and application of Orbitrap SIMS. The topics flow seamlessly into the next session about “Complementary Methods and Industrial Challenges” (ThA) where perspectives on practical approaches for problem-solving are discussed, including XPS and SPM on a broad range of materials like nanoparticles, photovoltaic devices, bitumen, and more. The Applied Surface Science Poster Session (ThP) will capture condensed highlights on all of these subjects on Thursday evening.
The division will hold its annual Business Meeting and Awards Ceremony on Tuesday evening. Highlights of this event include the student award competition and the ASTM E42 Committee on Surface Analysis forum. All members of the Applied Surface Science community are invited to attend.
AS-TuA: Theory, Surface Structure and Processes
- Jochen Autschbach, University at Buffalo, SUNY, “Calculation of X-Ray Absorption Spectra of f-Element Compounds from First Principles”
- Kevin Rosso, Pacific Northwest National Laboratory, “Advances in Understanding Structure and Electron Transfer Dynamics at Iron Oxide/Water Interfaces”
AS-WeM: Quantitative Surface Analysis
- Thierry Conard, IMEC, Belgium, “The Challenge of Quantifying Photoemission Spectra Using Multiple Photon Energies”
AS-WeA: Advanced Materials and Methods
- Anton Ievlev, Oak Ridge National Laboratory, “Ion Migration and Chemical Phenomena in Functional Materials: Correlative Studies via Combined AFM/Tof-SIMS Approach”
Marcus Rohnke, Justus Liebig University Giessen, Germany, “Characterization of Sodium-Ion Batteries – from Postmortem to Operando”
AS-ThM: Machine Learning and Data Evaluation
- Sarah Bamford, La Trobe University, Australia, “Stitching, Stacking, and Multilayering: Practical Evaluation of ToF-SIMS Data with Machine Learning”
- Alexander Pirkl, ION-TOF GmbH, Germany, “Hybrid SIMS: Evolution of a SIMS Instrument Combining Time-of-Flight and Orbital Trapping Mass Spectrometry”
AS-ThA: Complementary Methods and Industrial Challenges
AS-ThP: Applied Surface Science Poster Session